ISTQB CT-AuT Certification Exam Syllabus

CT-AuT dumps PDF, ISTQB CT-AuT Braindumps, free CTFL - Automotive Software Tester dumps, Automotive Software Tester dumps free downloadTo achieve the professional designation of ISTQB Certified Tester Automotive Software Tester from the ISTQB, candidates must clear the CT-AuT Exam with the minimum cut-off score. For those who wish to pass the ISTQB Automotive Software Tester certification exam with good percentage, please take a look at the following reference document detailing what should be included in ISTQB CTFL - Automotive Software Tester Exam preparation.

The ISTQB CT-AuT Exam Summary, Sample Question Bank and Practice Exam provide the basis for the real ISTQB Certified Tester Foundation Level - Automotive Software Tester (CT-AuT) exam. We have designed these resources to help you get ready to take ISTQB Certified Tester Automotive Software Tester (CT-AuT) exam. If you have made the decision to become a certified professional, we suggest you take authorized training and prepare with our online premium ISTQB Automotive Software Tester Practice Exam to achieve the best result.

ISTQB CT-AuT Exam Summary:

Exam Name ISTQB Certified Tester Automotive Software Tester
Exam Code CT-AuT
Exam Fee USD $215
Exam Duration 60 Minutes
Number of Questions 40
Passing Score 26 / 40
Format Multiple Choice Questions
Schedule Exam Pearson VUE
Sample Questions ISTQB CTFL - Automotive Software Tester Exam Sample Questions and Answers
Practice Exam ISTQB Certified Tester Foundation Level - Automotive Software Tester (CT-AuT) Practice Test

ISTQB Automotive Software Tester Syllabus Topics:

Topic Details

Introduction to Automotive Software Testing – 30 minutes

Requirements from Divergent Project Objectives and Increasing Product Complexity - Explain and give examples of the challenges of automotive product development that arise from divergent project objectives and increasing product complexity
Project Aspects Influenced by Standards - Recall project aspects that are influenced by standards (e.g., time, cost, quality, project risks and product risks)
The Six Generic Stages in the System Lifecycle - Recall the six generic stages in the system lifecycle per ISO/IEC/IEEE 24748-1
The Contribution and Participation of the Tester in the Release Process - Recall the role (i.e., contribution and collaboration) of the tester in the release process

Standards for the Testing of Electric/Electronic (E/E) Systems – 300 minutes

Automotive SPICE (ASPICE) - Recall the two dimensions of ASPICE
- Explain the capability levels 0 to 3 of ASPICE
- Recall the purpose of the test-specific processes of ASPICE
- Explain the meaning of the four rating levels and the capability indicators of ASPICE from the testing perspective
- Explain the requirements of ASPICE for a test strategy including the criteria for regression verification
- Recall the requirements of ASPICE for testware
- Use verification measures for software unit verification
- Explain the different traceability requirements of ASPICE from the testing perspective
ISO 26262 - Explain the objective of functional safety for E/E systems
- Recall the testers’ contribution to the safety culture
- Discuss the role of the tester in the framework of the safety lifecycle per ISO 26262
- Recall the parts of ISO 26262 that are relevant to the tester
- Recall the criticality levels of ASIL
- Explain the influence of ASIL on test techniques and test types for static testing and dynamic testing and the resulting test scope
- Use the method tables of ISO 26262
AUTOSAR - Recall the project objectives of AUTOSAR
- Recall the influence of AUTOSAR on the work of the tester
Comparison of ASPICE, ISO 26262, and CTFL® - Recall the different objectives of ASPICE and ISO 26262
- Explain the differences between ASPICE and ISO 26262 and CTFL® regarding test levels

Testing in a Virtual Environment – 160 minutes

Test environment in general - Recall the motivation behind a test environment in automotive development
- Recall the general parts of an automotive specific test environment
- Recall the differences between closed-loop systems and open-loop systems
- Recall the essential functions, databases and protocols of an ECU
Testing in XiL test environments - Recall the structure of a MiL test environment
  • Explain the application area and the boundary conditions of a MiL test environment

- Recall the structure of a SiL test environment

  • Recall the application areas and the boundary conditions of an SiL test environment

- Recall the structure of a HiL test environment

  • Explain the application areas and the boundary conditions of a HiL test environment

- Summarize the advantages and disadvantages of testing using criteria for the XiL test environments
- Apply criteria for the assignment of a given extent of the test to one or more test environments
- Outline the XiL test environments in the V-model

Static Testing and Dynamic Testing – 230 minutes

Static Testing - Explain the purpose and requirements of the MISRA-C guidelines with the help of examples
- Apply requirements review using quality characteristics of the ISO/IEC/IEEE 29148 standard that are relevant to testers
Dynamic Testing - Design test cases to achieve modified condition/decision testing coverage
- Explain the use of back-to-back testing by giving examples
- Explain fault injection testing by giving examples
- Recall the principles of requirements-based testing
- Apply context dependent criteria for the choice of suitable and necessary test techniques and test approaches

Both ISTQB and veterans who’ve earned multiple certifications maintain that the best preparation for a ISTQB CT-AuT professional certification exam is practical experience, hands-on training and practice exam. This is the most effective way to gain in-depth understanding of ISTQB CTFL - Automotive Software Tester concepts. When you understand techniques, it helps you retain ISTQB Automotive Software Tester knowledge and recall that when needed.

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